Indexed metadata
A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials
Shiladitya Chatterjee, Bhupinder Singh, Anubhav Diwan, Zheng Rong Lee, Mark H. Engelhard, Jeff Terry, H. Dennis Tolley, Neal B. Gallagher, Matthew R. Linford
Source record
Source: Crossref
Published: Mar 1, 2018
DOI: 10.1016/j.apsusc.2017.09.210
Open original source ↗Evidence graph
No public relationships recorded yet.
Integrity note: This page is a factual metadata record created by deterministic ingestion. It is not a claim that the work moves a mathematical frontier or has been independently verified.