Indexed metadata
Mathematical Modeling of Charge Transport in the Dielectric Layer of a HfOx Memristor Taking into Account Single Charged Traps
D. R. Islamov, T. M. Zalyalov, V. A. Voronkovskii, A. K. Markelova, A. A. Pil’nik, T. V. Perevalov, M. N. Davydov, A. A. Chernov
Source record
Source: Crossref
Published: Dec 1, 2025
DOI: 10.1134/s1063739725601821
Open original source ↗Evidence graph
No public relationships recorded yet.
Integrity note: This page is a factual metadata record created by deterministic ingestion. It is not a claim that the work moves a mathematical frontier or has been independently verified.