Differential electron yield imaging with STXM

William A. Hubbard, Jared J. Lodico, Xin Yi Ling, Brian T. Zutter, Young-Sang Yu, David A. Shapiro, B.C. Regan

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Source: Crossref

Published: Mar 1, 2021

DOI: 10.1016/j.ultramic.2020.113198

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