Extending the Schottky–Mott Rule to Atomic Thickness: Descriptors for Two-Dimensional Semiconductor–Metal Contacts

Xing Yu, Xinyu Chen, Xuchen Yu, Qionghua Zhou, Liang Ma, Jinlan Wang

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Source: Crossref

Published: Dec 1, 2025

DOI: 10.1021/acs.nanolett.5c05343

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