Electro-thermo-mechanical fracture and suppression of hypocycloid-type cracks: An analytical model for imperfect through-silicon via interfaces

Yi-Lun Liao, Ching-Kong Chao, Yu-Hsi Huang

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Source: Crossref

Published: Jan 1, 2027

DOI: 10.1016/j.apm.2026.117320

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