Gaussian fluctuations of Young diagrams under the Plancherel measure
Leonid V Bogachev, Zhonggen Su
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Source: Crossref
Published: Jan 30, 2007
DOI: 10.1098/rspa.2006.1808
Open original source ↗Source abstract
We obtain the central limit theorem for fluctuations of Young diagrams around their limit shape in the bulk of the ‘spectrum’ of partitions λ ⊢ n ∈ (under the Plancherel measure), thus settling a long-standing problem posed by Logan & Shepp. Namely, under normalization growing like , the corresponding random process in the bulk is shown to converge, in the sense of finite-dimensional distributions, to a Gaussian process with independent values, while local correlations in the vicinity of each point, measured on various power scales, possess certain self-similarity. The proofs are based on the Poissonization techniques and use Costin–Lebowitz–Soshnikov's central limit theorem for determinantal random point processes. Our results admit a striking reformulation after the rotation of Young diagrams by 45°, whereby the normalization no longer depends on the location in the spectrum. In addition, we explain heuristically the link with an earlier result by Kerov on the convergence to a generalized Gaussian process.
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