Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography

Xin Xu, Yuzi Liu, Jie Wang, Dieter Isheim, Vinayak P. Dravid, Charudatta Phatak, Sossina M. Haile

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Source: Crossref

Published: Apr 13, 2020

DOI: 10.1038/s41563-020-0656-1

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