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Statistical analysis of electronic excitation processes: Spatial location, compactness, charge transfer, and electron-hole correlation

Felix Plasser, Benjamin Thomitzni, Stefanie A. Bäppler, Jan Wenzel, Dirk R. Rehn, Michael Wormit, Andreas Dreuw

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Source: Crossref

Published: Jun 29, 2015

DOI: 10.1002/jcc.23975

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Statistical analysis of electronic excitation processes: Spatial location, compactness, charge transfer, and electron-hole correlation — Mathematical Frontier Network